Structural, Spectral and Dielectric characterization of non linear optical inorganic Diammonium Zinc (II) sulphate (DAZS) single crystals grown by slow evaporation solution method

  • Arivuselvi R School of Advanced Sciences, VIT University, Vellore - 632014, Tamilnadu, India.
  • Ruban Kumar A School of Advanced Sciences, VIT University, Vellore - 632014, Tamilnadu, India.
Keywords: Slow evaporation solution technique, single crystal X-ray diffraction, FTIR spectroscopy

Abstract

Diammine Zinc (II) Sulphate (DAZS) inorganic single crystal was grown by slow evaporation solution technique. The grown crystal has been characterized by  structural, spectral and dielectric analysis. The lattice parameters of the DAZS crystals were estimated by single crystal X-ray diffraction studies. The presence of various functional groups in the sample confirmed by FTIR spectroscopy .The response of dielectric constant and dielectric loss at different temperatures in the frequencies range 50 Hz-5 MHz has been investigated and results are discussed.

Published
2016-05-30